5 trabajo en Espectroscopía en Advanced Research Center for Nanolithography ARCNL

Encuentra trabajos en Espectroscopía en Advanced Research Center for Nanolithography ARCNL. Para recibir nuevos trabajos el día en que se publican, cree una alerta de trabajo.

RESULTADOS (5)
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Advanced Research Center for Nanolithography ARCNL
Ámsterdam, Holanda

PhD: Imaging Spectroscopy for Broadband EUV Source Size Characterization

Work Activities This fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration...

Publicado hace 1 semana
Closing in: 4 days
Doctorado
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Advanced Research Center for Nanolithography ARCNL
Ámsterdam, Holanda

PhD: Imaging Spectroscopy for Broadband EUV Source Size Characterization

Work ActivitiesThis fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration between the Advanced Research Center for Nanolitho...

Publicado hace 1 mes
Doctorado
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Advanced Research Center for Nanolithography ARCNL
Ámsterdam, Holanda

PhD: Electron-induced damage mechanisms in SEM imaging

Work ActivitiesThe goal of the project is to learn more about the possible detrimental effects of electrons in scanning electron microscopy for metrology applications, on materials used in the semiconductor industry. As a PhD student you will use ...

Publicado hace 2 meses
Doctorado
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Advanced Research Center for Nanolithography ARCNL
Ámsterdam, Holanda

Postdoc: electron-induced damage mechanisms in SEM imaging

Work ActivitiesThe goal of the project is to learn more about the possible detrimental effects of electrons in scanning electron microscopy for metrology applications, on materials used in the semiconductor industry. As a Postdoctoral Researcher y...

Publicado hace 2 meses
Postdoctorado
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Advanced Research Center for Nanolithography ARCNL
Ámsterdam, Holanda

PhD: Terahertz and optical metrology of semiconductor material changes

Work ActivitiesIn semiconductor device manufacturing, metrology tools are required for wafer alignment, overlay and device inspection. As devices become more complicated and as stronger light sources are being used to get sufficient signal from sa...

Publicado hace 2 meses
Doctorado